The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Sep. 05, 2014
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Sanjeev Jagannatha Koppal, Gainesville, FL (US);

Vikram VijayanBabu Appia, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2006.01); G01S 17/46 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01S 17/89 (2013.01); G01B 11/2527 (2013.01); G01S 17/46 (2013.01);
Abstract

A method for computing a depth map of a scene in a structured light imaging system including a time-of-flight (TOF) sensor and a projector is provided that includes capturing a plurality of high frequency phase-shifted structured light images of the scene using a camera in the structured light imaging system, generating, concurrently with the capturing of the plurality of high frequency phase-shifted structured light images, a time-of-flight (TOF) depth image of the scene using the TOF sensor, and computing the depth map from the plurality of high frequency phase-shifted structured light images wherein the TOF depth image is used for phase unwrapping.


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