The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Sep. 30, 2015
Siemens Aktiengesellschaft, Munich, DE;
Thomas Benner, Erlangen, DE;
Swen Campagna, Engelthal, DE;
Thorsten Feiweier, Poxdorf, DE;
Bernd Kuehn, Uttenreuth, DE;
Thorsten Speckner, Erlangen, DE;
Peter Speier, Erlangen, DE;
Daniel Nico Splitthoff, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method for determining time windows in a scan sequence, in which values of setting parameters of a scan can be changed during a current scan without adversely affecting the scan data obtained with the scan, comprising the following a scan sequence is loaded into a control computer, that then determines the time windows in the scan sequence in which values of setting parameters can be changed during a current scan, on the basis of an analysis of useful coherences in the scan sequence. The determined time windows are stored or processed so as to be available to operate an imaging apparatus to execute the scan sequence.