The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Dec. 18, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Jonathan R. Fry, Wappingers Falls, NY (US);
Christopher Klabes, Poughkeepsie, NY (US);
Andrew J. Martin, Carmel, NY (US);
Vincent J. McGahay, Poughkeepsie, NY (US);
Kathryn E. Schlichting, Pleasant Valley, NY (US);
Melissa A. Smith, Wappingers Falls, NY (US);
Assignee:
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/28 (2006.01); G01C 22/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2896 (2013.01); G01C 22/00 (2013.01);
Abstract
Approaches for detecting wear in integrated circuit chips are provided. An on-chip sensor system includes an integrated circuit chip including a plurality of sensor groups. Each respective one of the sensor groups is structured and arranged to detect a measure of wear corresponding to a respective one of a plurality of failure mechanisms.