The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Sep. 19, 2017
Htc Corporation, Taoyuan, TW;
Fu-Chiang Chou, Taoyuan, TW;
Yung-Lung Chang, Taoyuan, TW;
Fu-Cheng Fan, Taoyuan, TW;
Yi-Chi Lin, Taoyuan, TW;
Chin-Hua Hsieh, Taoyuan, TW;
Wei-Cheng Hsu, Taoyuan, TW;
Syuan-He Shih, Taoyuan, TW;
HTC Corporation, Taoyuan, TW;
Abstract
A method for test strip recognition and interpretation is provided. The method includes the following steps. A plurality of test strips are provided, wherein the test strips are configured to examine a plurality of physiologic parameters respectively, and the test strips respectively have a plurality of color characteristics corresponding to the physiologic parameters respectively. A plurality of physiologic parameter examinations are performed to the corresponding test strips respectively, so as to obtain a plurality of test reactions. An image of the test strips is captured. The color characteristics and the test reactions of the test strips are obtained according to the image. The physiologic parameters examined by the test strips respectively are obtained according to the color characteristics. The physiologic parameters examined by the test strips are matched with the test reactions to obtain a plurality of physiologic parameter examination results.