The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Apr. 01, 2016
Applicant:

Captl Llc, West Lafayette, IN (US);

Inventors:

Masanobu Yamamoto, West Lafayette, IN (US);

J. Paul Robinson, West Lafayette, IN (US);

Assignee:

CAPTL LLC, West Lafayette, IN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/47 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/47 (2013.01); G01N 15/1434 (2013.01);
Abstract

An example assembly includes a target holder that retains a target in a detection region. A reflective surface reflects at least part of a focused spot of light to provide resultant light. An irradiation system irradiates at least part of the detection region with the focused spot of light. A motion system causes motion of the focused spot of light relative to the reflective surface. A detection system detects the resultant light. An example device, e.g., a lab-on-chip, includes a substrate, a sample inlet, and a reflective grating. The grating is retains a fluidic sample in a detection region fluidically connected to the sample inlet. The detection region is operatively arranged with respect to the reflective grating so that at least a portion of light passing through the detection region towards the reflective grating also passes through the detection region after reflecting off the reflective grating.


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