The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

May. 17, 2016
Applicant:

Council of Scientific & Industrial Research, New Delhi, IN;

Inventors:

Syed Azhar Rasheed Hashmi, Bhopal, IN;

Hari Narayan Bhargaw, Bhopal, IN;

Ajay Naik, Bhopal, IN;

Jagdish Prasad Pandey, Bhopal, IN;

Mulayam Singh Yadav, Bhopal, IN;

Navin Chand, Bhopal, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/24 (2006.01); G01B 7/04 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/002 (2013.01);
Abstract

A shape memory effect measuring apparatus is provided that is useful for tensile stress, strain and recovery stress measurement. The apparatus includes a load cell, a linear variable displacement transducer, a temperature sensor, a rigid platform, a computer-based data recorder and a processing system a load frame, grips to hold sample, and a liquid bath. The liquid bath is mounted on the rigid stand platform to hold the liquid bath. A uniform temperature of liquid is attained by controlled heating and stirring arrangement. The computer-based processing system may be used to monitor and control the desired temperature of the sample. A change in length of a specimen and stress generated during expansion thereof may be recorded, from which strain and stress may be calculated using the apparatus.


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