The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Apr. 25, 2016
Applicant:

Morpho Detection, Llc, Newark, CA (US);

Inventors:

Anish Bekal, Bangalore, IN;

Sameer Dinkar Vartak, Bangalore, IN;

Rachit Sharma, Bangalore, IN;

Assignee:

MORPHO DETECTION, LLC, Newark, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/433 (2006.01); G01J 3/28 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4338 (2013.01); G01J 3/0218 (2013.01); G01J 3/2803 (2013.01);
Abstract

A method for correcting frequency offset in a dual comb spectroscopy system is provided. The method includes causing a first laser (L1) generator to transmit L1 pulses at a repetition rate of a first frequency and causing a second laser (L2) generator to transmit L2 pulses at a repetition rate of a second frequency. The method also includes interrogating a reference material using a combination of the L1 pulses and the L2 pulses and capturing reference cell pulses. The method further includes interrogating a material of interest using the L1 pulses and capturing material of interest pulses. The method includes determining a frequency jitter based on the captured reference cell pulses and the combination of the captured material of interest pulses and the L2 pulses.


Find Patent Forward Citations

Loading…