The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Jan. 19, 2016
Xerox Corporation, Norwalk, CT (US);
David C. Craig, Pittsford, NY (US);
Robert P. Herloski, Webster, NY (US);
David A. Mantell, Rochester, NY (US);
Douglas E. Proctor, Rochester, NY (US);
Jonathan B. Hunter, Marion, NY (US);
Stuart Schweid, Pittsford, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method of spatially and spectrally calibrating a spectrophotometer including: a) emitting a white light illumination output from a full width illumination source; b) illuminating a test patch with the white light illumination output; c) reflecting a portion of the white light illumination output from the test patch to form a white light reflected illumination output; d) receiving the white light reflected illumination output at first, second and third rows of photosensitive elements to form a first calibration data set; e) emitting a cyan light illumination output from the full width illumination source; f) illuminating the test patch with the cyan light illumination output; g) reflecting a portion of the cyan light illumination output from the test patch to form a cyan light reflected illumination output; and, h) receiving the cyan light reflected illumination output at the second and third rows of photosensitive elements to form a second calibration data set.