The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2018
Filed:
Sep. 22, 2014
Datalogic Usa, Inc., Eugene, OR (US);
Alexander M. McQueen, Eugene, OR (US);
Matt D Schler, Eugene, OR (US);
DATALOGIC USA, INC., Eugene, OR (US);
Abstract
In a scanner-scale system for passing items through a read zone over a weigh platter of the scanner-scale, the system including an item overhang detection system operable for providing an output upon sensing that an item overhangs beyond an edge of the weigh platter, systems and methods are disclosed for using output from the item overhang detection system to both (1) reduce erroneous weighing upon sensing that an item overhangs beyond an edge of the weigh platter (such as by alerting the operator that an item overhang condition has been detected and thus prompting the operator to reposition the item so as to be fully on scale) and (2) initiate an alternate function of the scanner-scale independent of weighing operation.