The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Jul. 19, 2017
Applicant:

Shanghai University of Engineering Science, Shanghai, CN;

Inventors:

Xiang Liu, Shanghai, CN;

Yunyu Shi, Shanghai, CN;

Yongxiang Xia, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); H04N 5/14 (2006.01); H04N 5/372 (2011.01);
U.S. Cl.
CPC ...
G01B 11/06 (2013.01); H04N 5/142 (2013.01); H04N 5/372 (2013.01); G06T 2215/16 (2013.01);
Abstract

The present invention relates to a parallel image measurement method oriented to the insulating layer thickness of a radial symmetrical cable section. The method conducts the non-contact high-accuracy measurement based on the machine vision and the image analysis, adopts a GPU multi-core parallel platform for the high-speed measurement, extracts the useful information from the section image of the radial symmetrical cable, and then measures the insulating layer thickness. Compared with the prior art, the present patent can lower the time consumed for the accurate measurement, fill in the blank of the high-accuracy parallel image measurement of the insulating layer thickness of the radial symmetrical cable section in the domestic cable industry, break down the monopoly and technology blockade by related foreign manufacturers and improve the technology level of on-line testing of product quality in China, expedite the production automation progress of domestic manufacturer.


Find Patent Forward Citations

Liu, Xiang. (2018). Parallel image measurement method oriented to the insulating layer thickness of a radial symmetrical cable section (U.S. Patent No. 10060726). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10060726

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