The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Apr. 24, 2014
Applicant:

Helmut Fischer Gmbh Institut Fur Elektronik Und Messtechnik, Sindelfingen, DE;

Inventor:

Werner Volz, Sindelfingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01); G01D 11/10 (2006.01);
U.S. Cl.
CPC ...
G01B 7/06 (2013.01); G01B 7/105 (2013.01); G01D 11/10 (2013.01);
Abstract

A measuring probe for the measurement of the thickness of thin layers, includes a housing, at least one sensor element which is mounted with at least one spring element to be flexible with respect to the housing, the sensor element having a spherical positioning cap pointing towards the measuring surface of an object of measurement against a touchdown direction and along a longitudinal axis thereof, and an attenuating device on the housing which acts in the touchdown direction of the at least one sensor element before the sensor element is fitted onto the measuring surface of the object of measurement and attenuates the touchdown movement of the at least one sensor element in the direction of the measuring surface of the object of measurement.


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