The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Jan. 06, 2015
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Rolf Karl Otto Behling, Hamburg, DE;

Petrus Johannes Withagen, Eindhoven, NL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4035 (2013.01);
Abstract

An X-ray emitting device () with an attenuating element () for an X-ray imaging device () is proposed. The attenuating element comprises a perforated sheet () of strongly X-ray absorbing material such as e.g. tungsten or molybdenum with a sheet thickness of e.g. less than 1 mm. The sheet () comprises multiple pinhole openings (). Therein, a density of pinhole openings is higher at a center region of the sheet than at border regions of the sheet. Accordingly, a transparency to X-rays is higher at the center region than at the border regions. The pinhole openings () have geometries such that most parts of contours of the pinhole openings are non-parallel to edges of a focal spot () of an X-ray source () comprised in the X-ray emitting device. For example, the pinhole openings may have a circular, oval or any other cross-sectional geometry with non-linear edges. In an X-ray imaging device, such attenuating element may avoid beam hardening, needs less space than a conventional bow tie filter and is relatively insensitive to focal spot shifts.


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