The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Aug. 29, 2016
International Business Machines Corporation, Armonk, NY (US);
Nicolas Dupuis, New York, NY (US);
Daniel M. Kuchta, Patterson, NY (US);
Benjamin G. Lee, Ridgefield, CT (US);
Alexander Rylyakov, Staten Island, NY (US);
Clint L. Schow, Santa Barbara, CA (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
Methods and systems for bias control in an optical switch fabric include monitoring optical power at outputs of a plurality of switch elements in an N×N switch fabric that has N inputs, N outputs, and M≥2 stages. A bias control of a first of the plurality of switch elements is adjusted. It is determined whether the optical power at the outputs of the first switch element after bias control adjustment conform more closely to a predetermined criterion relative to the monitored optical power at the outputs of the first switch element prior to adjustment. The adjusting and determining steps are repeated for each of the remainder of the plurality of switch elements.