The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Jun. 01, 2015
Flir Systems, Inc., Wilsonville, OR (US);
Adam C. Espersen, Portland, OR (US);
Stephen V. McKaughan, The Villages, FL (US);
Nicholas J. Lagadinos, Billerica, MA (US);
FLIR Systems, Inc., Wilsonville, OR (US);
Abstract
Systems and methods according to one or more embodiments are provided for an imaging system having a plurality of sensors associated with input optics. In one example, an imaging system includes input optics configured to receive incident radiation along an input optical axis and a first optical sensor and a second optical sensor, each configured to detect the incident radiation. The imaging system further includes a rotating member positioned between the first and second optical sensors and configured to rotate about the input optical axis and a reflector coupled to the rotating member configured to be selectively positionable by the rotating member to a first orientation, in which the reflector directs the incident radiation along a first secondary axis to the first optical sensor, and to a second orientation, in which the reflector directs the incident radiation along a second secondary axis toward the second optical sensor.