The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Jul. 28, 2017
Bae Systems Information and Electronic Systems Integration Inc, Nashua, NH (US);
Michael J. Bowers, II, Sykesville, MD (US);
Pierre-Alain S. Auroux, Rockville, MD (US);
Thomas E. Collins, III, Tyngsboro, MA (US);
James A. Stobie, Westford, MA (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
Techniques are provided for a physically unclonable function (PUF) device. One example PUF device includes, a readout integrated circuit (ROIC) (such as a ROIC for a focal plane array or other imaging application), a nanomaterial-based PUF layer on the ROIC, and a common electrode on the PUF layer. The nanomaterial is randomly distributed throughout the PUF layer. A method of using a PUF device that includes a nanomaterial-based PUF layer coupled to a ROIC, where the nanomaterial is randomly distributed throughout the PUF layer, includes driving the ROIC at a plurality of locations coupled to a corresponding plurality of locations of the PUF layer, sensing the nanomaterial at the locations of the PUF layer, and generating a unique identification key from the sensed locations of the PUF layer. The method can be used, for example, for secure decryption or for identifying or authenticating the PUF device.