The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Feb. 14, 2017
Applicant:

Qorvo Us, Inc., Greensboro, NC (US);

Inventor:

Christian Rye Iversen, Vestbjerg, DK;

Assignee:

Qorvo US, Inc., Greensboro, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/13 (2014.01); G01R 25/00 (2006.01); H02H 3/30 (2006.01); H03K 5/00 (2006.01); G01R 23/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/13 (2013.01); G01R 25/005 (2013.01); H02H 3/302 (2013.01); G01R 23/005 (2013.01); H03K 2005/00286 (2013.01);
Abstract

An RF phase offset detection system, which includes a first RF phase detector and a second RF phase detector, and measures a first phase offset between a first RF signal and a second RF signal, is disclosed. Each of the first RF signal and the second RF signal has a common RF frequency. The first RF phase detector detects and filters the first RF signal and the second RF signal to provide a first detection signal. The second RF phase detector receives and phase-shifts the second RF signal to provide a phase-shifted RF signal. The second RF phase detector further detects and filters the first RF signal and the phase-shifted RF signal to provide a second detection signal, such that a combination of the first detection signal and the second detection signal is representative of the first phase offset.


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