The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Nov. 18, 2013
Koninklijke Philips N.v., Eindhoven, NL;
Oren Ofer, Mitspe Aviv, IL;
Oren Zarchin, Raanana, IL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An imaging system () includes a radiation source () that emits radiation that traverses in a direction of an examination region () during a scan and a detector array () located opposite the radiation source, across the examination region, which detects radiation traversing the examination region during the scan and produces a signal indicative thereof. A beamshaper (), located between the radiation source and the examination region, defines a flux intensity profile of the radiation beam traversing the examination region. The beamshaper includes a plurality of x-ray attenuating elements(), which attenuate x-rays incident thereon, interleaved with a plurality of material free regions, which pass x-ray unattenuated. A transmittance of the x-rays is greater nearer a center region of the beamshaper relative to ends regions of the beamshaper. A beamshaper mover () translates the beamshaper during at least one acquisition interval of the scan.