The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Jul. 05, 2017
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Edmun Chian Song Seng, Singapore, SG;

Det Hau Wu, Singapore, SG;

Lin Nah Lim, Singapore, SG;

Jose Mari Corral Toribio, Singapore, SG;

Luh Chyuan Lau, Singapore, SG;

Utt Heng Kan, Singapore, SG;

Meng Suan June Lee, Singapore, SG;

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 20/10 (2006.01); G11B 5/00 (2006.01);
U.S. Cl.
CPC ...
G11B 20/10222 (2013.01); G11B 5/09 (2013.01); G11B 2005/0021 (2013.01);
Abstract

A method involves determining bit aspect ratios for interlaced tracks written to a magnetic recording medium. The interlaced tracks include top tracks that are written partially overlapping and interlaced with bottom tracks. Isolated test tracks are written at first different bit aspect ratios to determine a top bit aspect ratio that achieves a first target areal density for the isolated test tracks. Interlaced test tracks are written at second different bit aspect ratios to determine a bottom bit aspect ratio that achieves a second target areal density for the interlaced test tracks. Top test tracks of the interlaced test tracks are written at the top bit aspect ratio. The top and bottom bit aspect ratios are selected to subsequently write interlaced tracks on the magnetic recording medium.


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