The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Oct. 12, 2015
Honeywell International Inc., Morris Plains, NJ (US);
Stephane Savard, Vancouver, CA;
Frank Martin Haran, N. Vancouver, CA;
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A method of pulsed radar interface determination for a first and second material in a tank. An interface level determination model is provided including a transfer function that utilizes refractive indices for the materials and thickness of the second material. At least one actual radar pulse is transmitted into the tank and a resulting echo curve portion including a measured interface pulse(s) around the interface location is measured. The interface model is simulated with a reference pulse and an initial thickness value to generate an initial model generated interface pulse (initial MGIP). The measured interface pulse is compared to the initial MGIP pulse point-by-point to determine residuals. If the residuals sum >a predetermined threshold, the comparing is repeated with an updated interface model generated with an updated thickness value that provides an updated MGIP pulse. When the sum of residuals is ≤predetermined threshold, the thickness is determined.