The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Sep. 14, 2017
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Joel C. Dubbels, Rochester, MN (US);
Mark G. Megerian, Rochester, MN (US);
William C. Rapp, Rochester, MN (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/24 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30011 (2013.01); G06F 17/241 (2013.01); G06F 17/30442 (2013.01); G06F 17/30958 (2013.01);
Abstract
Corpus-scoped annotation and analysis. Enrichment analysis data is generated including annotations and metadata for a plurality of documents that are part of a corpus. Whether to generate a second set of annotations is determined, based on a correlation of the annotations and metadata. A relational database is populated with the enrichment analysis data. A corpus-scoped query is resolved, initiated by an application, using the enrichment analysis data and content of the corpus.