The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Sep. 20, 2016
Applicant:

Daylight Solutions, Inc., San Diego, CA (US);

Inventors:

Jeremy Rowlette, Escondido, CA (US);

Eric Kim, San Diego, CA (US);

Assignee:

DAYLIGHT SOLUTIONS, INC, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); H04N 5/33 (2006.01); G02B 21/34 (2006.01); G02B 21/06 (2006.01); G02B 27/56 (2006.01); G02B 21/02 (2006.01); G02B 21/26 (2006.01); G02B 7/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); G02B 7/003 (2013.01); G02B 21/02 (2013.01); G02B 21/06 (2013.01); G02B 21/26 (2013.01); G02B 21/34 (2013.01); G02B 21/365 (2013.01); G02B 27/56 (2013.01); H04N 5/33 (2013.01);
Abstract

An imaging microscope for spectrally analyzing a sample includes (i) a laser source that generates an interrogation beam; (ii) an attenuated total reflection assembly that includes an ATR crystal and a sample holder that holds the sample in intimate contact with the ATR crystal; (iii) an objective lens assembly that collects a reflected beam and focuses the reflected beam; and (iv) a two dimensional image sensor that receives the focused, reflected beam and captures two dimensional image information that is used to generate an image of the sample, the image sensor being operable in the mid-infrared range.


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