The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Mar. 22, 2017
Applicant:
Robert David Frankel, Rochester, NY (US);
Inventor:
Robert David Frankel, Rochester, NY (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/16 (2006.01); G01N 21/65 (2006.01); G01N 33/483 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0056 (2013.01); G01N 21/6458 (2013.01); G01N 21/65 (2013.01); G01N 33/4833 (2013.01); G02B 21/00 (2013.01); G02B 21/0032 (2013.01); G02B 21/0048 (2013.01); G02B 21/16 (2013.01); G01N 2021/655 (2013.01); G01N 2021/656 (2013.01); G01N 2201/067 (2013.01); G01N 2201/0697 (2013.01);
Abstract
A microscopy system that includes a first laser emitting a first laser pulse along a first beam line, the first laser pulse being a Gaussian pump beam; and a second laser emitting a second laser pulse along a second beam line, the second laser pulse being a probe beam, the Gaussian pump beam and the probe beam being delivered to a sample at right angles to each other allowing the Gaussian pump beam to shrink a focal axial diameter of the second beam line thereby enabling dipole-like backscatter stimulated emission along the second beam line.