The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Sep. 30, 2013
Applicant:

Hoya Corporation, Tokyo, JP;

Inventors:

Nobuyuki Tadokoro, Tokyo, JP;

Naomi Ogawa, Tokyo, JP;

Makoto Adachi, Tokyo, JP;

Yuko Komine, Tokyo, JP;

Koushi Harada, Tokyo, JP;

Assignee:

HOYA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/14 (2015.01); G02C 7/02 (2006.01); G02B 1/10 (2015.01); C23C 14/24 (2006.01); C23C 14/08 (2006.01); G02B 1/12 (2006.01); C23C 14/22 (2006.01);
U.S. Cl.
CPC ...
G02B 1/14 (2015.01); C23C 14/083 (2013.01); C23C 14/22 (2013.01); C23C 14/24 (2013.01); G02B 1/10 (2013.01); G02B 1/105 (2013.01); G02B 1/12 (2013.01); G02C 7/02 (2013.01); G02C 7/022 (2013.01); G02C 2202/16 (2013.01);
Abstract

An aspect of the present invention relates to an eyeglass lens comprising a lens substrate and a vapor-deposited film either directly or indirectly on the lens substrate, wherein the vapor-deposited film is an oxide film of metal selected from the group consisting of zirconium and tantalum, with an average grain size observed in a planar image obtained by a transmission electron microscope of equal to or greater than 3.5 nm and a proportion accounted for by grain boundaries, which are boundaries separating grains from regions outside of the grains, in a planar image obtained by a transmission electron microscope of less than 15%.


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