The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Mar. 31, 2017
Applicant:

Vieworks Co., Ltd., Gyeonggi-do, KR;

Inventors:

Denny Lap Yen Lee, Westchester, PA (US);

Hyun Suk Jang, Gyeonggi-do, KR;

Assignee:

Vieworks Co., Ltd., Anyang-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); H01L 27/146 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); G01T 1/241 (2013.01); H01L 27/14603 (2013.01); H01L 27/14676 (2013.01);
Abstract

The invention relates to a two steps image capture panel for recording x-ray image information. More particularly, the invention relates to a method and an apparatus for directing the internal electric field to capture the x-ray image first on an insulating surface, avoiding charge injection noise from the insulating surface, and then re-directing the internal electrical field to transfer the image charge from the insulating surface to a conductive readout electrode with electric field sufficient for charge gain during image readout.


Find Patent Forward Citations

Lee, Denny Lap Yen. (2018). Radiation imaging detector with proportional charge gain during readout (U.S. Patent No. 10054695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10054695

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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