The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Oct. 17, 2017
Applicant:

Stanley Electric Co., Ltd., Meguro-ku, Tokyo, JP;

Inventors:

Yasuo Toko, Tokyo, JP;

Yasuyuki Kawakami, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01S 7/481 (2006.01); G02F 1/29 (2006.01); G01S 17/06 (2006.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4816 (2013.01); G01S 17/06 (2013.01); G02F 1/29 (2013.01); G02B 6/42 (2013.01); G02F 2201/02 (2013.01); G02F 2201/121 (2013.01); G02F 2203/24 (2013.01);
Abstract

To reduce the size, simplify the structure of a light emitting and receiving system. The system that detects a target object with the use of reflected lights gained from a light irradiated to the target object includes a flat-plate shaped light control apparatus having light control parts, a light-entry apparatus allowing light to enter into a light control part, a light-receiving apparatus that receives emitting lights from the remaining light control parts, a control apparatus that controls the light-entry apparatus and the light-receiving apparatus and detects the target object. The light control apparatus includes liquid crystal elements supporting light control parts between a pair of substrates and a drive unit to drive the liquid crystal elements. Each of the light control parts includes a pair of electrodes, a high-resistance film disposed between the electrodes, and a liquid crystal layer disposed at least to the region overlapping the high-resistance film.


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