The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Oct. 30, 2015
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventor:
Sung-Soo Chi, Gyeonggi-do, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31724 (2013.01); G11C 29/56 (2013.01);
Abstract
A test device includes: a test control unit suitable for detecting a deterioration-expected unit circuit among a plurality of unit circuits included in a test-subject device according to operation histories of the plural unit circuits, and detecting a deterioration degree according to a test output value of the deterioration-expected unit circuit; and an interface unit suitable for routing control operation results and test results between the test control unit and the test-subject device during a test operation.