The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Jul. 19, 2012
Applicants:

Eric Estebe, Paris, FR;

Pierre Levy, Versailles, FR;

Alain Bouedo, Fontenay-le-Fleury, FR;

Inventors:

Eric Estebe, Paris, FR;

Pierre Levy, Versailles, FR;

Alain Bouedo, Fontenay-le-Fleury, FR;

Assignee:

THALES, Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H01Q 3/26 (2006.01); H01Q 17/00 (2006.01); G01S 7/40 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 29/10 (2013.01); G01S 7/4026 (2013.01); H01Q 3/267 (2013.01); H01Q 17/00 (2013.01); G01S 2007/4086 (2013.01);
Abstract

A device includes a test enclosure defining a cavity forming an anechoic chamber, having a test probe placed inside the cavity. The cavity comprises an aperture against which the radiating surface of antenna is positioned. The device includes a microwave-frequency test signal generator and a receiver for microwave-frequency signal emitted by the antenna under test and for measuring its amplitude and its phase in relation to a reference. Depending on the depth of the cavity and the dimensions of the radiation pattern of a test probe, the device comprises one or more test probes placed in fixed positions in the cavity or a mobile probe that can be positioned in various locations of the cavity, the probe or probes being configured and arranged to illuminate the whole active surface of the antenna and that the radiation pattern of each radiating element illuminates at least one test probe.


Find Patent Forward Citations

Loading…