The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Aug. 18, 2015
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Matthias Knoth, San Jose, CA (US);

Conrad H. Ziesler, Seattle, WA (US);

Toshinari Takayanagi, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/10 (2006.01); H01L 21/66 (2006.01); G01R 19/25 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); G01R 19/0084 (2013.01);
Abstract

In an embodiment, an integrated circuit includes a first circuit and a characterization circuit to capture a histogram of the supply voltage magnitude to the first circuit (or other characteristics of the first circuit). In various embodiments, the characterization circuit may: be located near the first circuit; include a sample/hold circuit that may sample the supply voltage in a short window of time and an ADC that is configured to converge to the sampled voltage over multiple orders of magnitude longer than the short window; be relatively small and low power; capture multiple histograms, e.g. one for each mode of the first circuit; support a blackout interval during mode changes; support a zoom feature to a subrange of supply voltage disabled with fine-grain histogram buckets; and/or include one or more comparators to detect maximum and/or minimum voltages experienced over a time interval.


Find Patent Forward Citations

Loading…