The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Jul. 18, 2014
Hideki Soejima, Tokyo, JP;
Yoji Okabe, Tokyo, JP;
Hideki Soejima, Tokyo, JP;
Yoji Okabe, Tokyo, JP;
SUBARU CORPORATION, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
Abstract
The object of the invention is to provide a damage diagnostic system that uses a damage detection system that obtains propagation intensity distribution data, which is expanded in the two dimensions frequency and propagation time, by converting the output value from an oscillation detection sensor that was obtained when oscillation is performed by an oscillator, and for one mode or two or more modes that are selected from the fundamental mode and higher mode of Lamb waves, obtains certain characteristic values from the data, for example three indices, which are the slope of the mode dispersion of the A1 mode (rate of change of the propagation time with respect to the frequency), the amount of decrease in the propagation time of the A1 mode, and the amount of increase in the propagation time of the S0 and S1 modes, and outputs the measurement results. The measurement results are displayed on a display device.