The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

May. 17, 2016
Applicant:

Airviz Inc., Pittsburgh, PA (US);

Inventors:

Illah Nourbakhsh, Pittsburgh, PA (US);

Joshua Schapiro, Pittsburgh, PA (US);

Michael D. Taylor, Pittsburgh, PA (US);

Assignee:

Airviz Inc., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01D 18/00 (2006.01); G01K 15/00 (2006.01); G02B 6/00 (2006.01); G01N 15/14 (2006.01); G01N 15/06 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1429 (2013.01); G01N 15/06 (2013.01); G01N 2015/0693 (2013.01); G01N 2015/1068 (2013.01);
Abstract

Systems and methods batch calibrate environmental sensors. Candidate environmental sensors and a high-performance reference sensor are located in an enclosure with a particle excitation system that controls the particle concentration in the enclosure. The calibration process includes multiple phases with different particle concentrations, and the candidate and reference sensors continuously report their particle counts to a calibration server during these phases. Based on the collected data, the calibration server: (i) identifies for removal candidate sensors with outlying behavior through statistical analysis; and (ii) computes calibration values for the particle count estimation algorithms for the remaining candidate sensors that are optimized to minimize the error relative to the reference sensor(s).


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