The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2018

Filed:

Mar. 24, 2017
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventors:

Yuki Takahashi, Ina, JP;

Hiroyuki Seki, Hachioji, JP;

Masahiro Uehara, Nagano, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2518 (2013.01);
Abstract

A shape measurement apparatus includes: a holder for holding a measuring object having a spherical measurement surface; a sensor configured to emit light onto the measurement surface to perform non-contact measurement of a distance between the sensor and the measurement surface and output a measured value; a rotation mechanism for rotating the sensor around a first axis; a sensor movement mechanism for moving the sensor along a second axis orthogonal to the first axis so as to be movable across an intersection of the second axis with the first axis; a holder movement mechanism for moving the holder along a vertical direction and on a plane orthogonal to vertical direction; and a control device configured to: calculate the shape of the measurement surface based on the measured value; calculate a spherical center of the measurement surface; and cause the holder movement mechanism to match the spherical center with the intersection.


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