The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
May. 14, 2015
Adom, Advanced Optical Technologies Ltd., Lod, IL;
Yoel Arieli, Jerusalem, IL;
Yoel Cohen, Nes Ziona, IL;
ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD., Lod, IL;
Abstract
A system () for analyzing an object () includes a light source () producing multiple light components, each of different wavelength and a respective amplitude, phase and polarization. An optical element () directs the light components on to the object to create known 2D patterns at different image planes displaced from the optical element by distances that are known functions of the wavelength of the light component. A 2D imager () images the 2D patterns and produces a plurality of full view 2D wavelength dependent patterns each corresponding to a known distance from the optical element and each having variable image contrast dependent on displacement of a surface of the object from the image plane, maximal image contrast being achieved when the surface of the object and image plane are coincident. A processing unit () determines the object surface based on the variable image contrast of each image.