The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Mar. 23, 2017
Olympus Corporation, Tokyo, JP;
Masayoshi Yokota, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
An inner surface shape measurement device for measuring a shape of an inner surface of a test target, and includes a light source, an optical system which converts light emitted by the light source into a disc-shaped light beam to cause the light beam to be emitted toward an inner surface of the test target, a photography unit which captures an image of a state in which the light beam is projected on the inner surface of the test target, and a wiring which supplies power for driving the light source. The optical system, the light source and the photography unit are disposed in this order along a same axis line, and the wiring extends from the light source toward the photography unit.