The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2018
Filed:
Apr. 29, 2015
Applicant:
Adom, Advanced Optical Technologies Ltd., Lod, IL;
Inventors:
Yoel Arieli, Jerusalem, IL;
Yoel Cohen, Nes Ziona, IL;
Assignee:
ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD., Lod, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02047 (2013.01); G01B 9/0209 (2013.01); G01B 9/02091 (2013.01);
Abstract
A method for high dynamic range and high accuracy interferometry measurements is described. The method uses a broadband light source for generating light, an interferometer, a phase shifting device, an imaging optical system and a detector array for collecting and measuring the reflected light from an object. The detected light is processed by a processor unit to obtain the object's surface.
Arieli, Yoel. (2018). Method for analyzing an object using a combination of long and short coherence interferometry (U.S. Patent No. 10054419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10054419
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile