The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Aug. 22, 2017
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventors:
Shigeru Kato, Tokyo, JP;
Sumito Honda, Tokyo, JP;
Kensei Ito, Sagamihara, JP;
Hiroshi Kodama, Tokyo, JP;
Osamu Nonaka, Sagamihara, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 13/00 (2018.01); H04N 7/22 (2006.01);
U.S. Cl.
CPC ...
H04N 13/0018 (2013.01); H04N 7/22 (2013.01); H04N 13/0003 (2013.01); H04N 7/18 (2013.01); H04N 2013/0081 (2013.01);
Abstract
An image observation apparatusincludes an imaging unitthat images a specimen K and obtains a magnified image of the specimen, a displaythat displays an image, a condition determiner that determines whether a state of the specimen with respect to the imaging unit satisfies a specific condition, and a controller that displays the magnified image obtained by the imaging unit on the display when the condition determiner determines the state of the specimen with respect to the imaging unit satisfies the specific condition.