The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Dec. 07, 2017
Applicant:

Stichting Imec Nederland, Eindhoven, NL;

Inventors:

Ming Ding, Eindhoven, NL;

Pieter Harpe, Eindhoven, NL;

Hanyue Li, Eindhoven, NL;

Assignee:

Stichting IMEC Nederland, Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1009 (2013.01);
Abstract

A method of gain calibration in a SAR ADC is disclosed. In one aspect, the method comprises determining a number of bits of an analog input signal (V), detecting if a binary code determined from the analog input signal (V) matches at least one trigger code, using at least one setting code to determine a calibration residue signal (V*) and a calibration bit (B*), analyzing a least significant bit of the digital signal (C) and the calibration bit (B*), determining an indication of a presence of gain error in the gain module, and calibrating the gain error. As the determination of the calibration bit (B*) requires only one additional comparison, as compared to normal operation, the normal operation does not need to be interrupted. Therefore, the calibration can be done in the background and, as such, can be performed frequently thereby taking into account time-varying changes due to environmental effects.


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