The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Mar. 03, 2011
Applicants:

Malcolm Scott Allen-ware, Austin, TX (US);

John Bruce Carter, Austin, TX (US);

Elmootazbellah Nabil Elnozahy, Austin, TX (US);

Wei Huang, Austin, TX (US);

Inventors:

Malcolm Scott Allen-Ware, Austin, TX (US);

John Bruce Carter, Austin, TX (US);

Elmootazbellah Nabil Elnozahy, Austin, TX (US);

Wei Huang, Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/34 (2006.01);
U.S. Cl.
CPC ...
H01L 23/34 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A method, system, and computer program product for on-chip control of thermal cycling in an integrated circuit (IC) are provided in the illustrative embodiments. A first circuit is configured on the IC for adjusting a first voltage being applied to a first part of the IC. A first temperature of the first part is measured at a first time. A determination is made that the first temperature is outside a temperature range defined by an upper temperature threshold and a lower temperature threshold. The first voltage is adjusted by reducing the first voltage when the first temperature exceeds the upper temperature threshold and by increasing the first voltage when the first temperature is below the lower temperature threshold, thereby causing the first temperature of the first part to attain a value within the temperature range.


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