The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Aug. 29, 2016
Applicant:
Cephx Technologies Ltd., Herzeliya, IL;
Inventors:
Zeev Abraham, Herzeliya, IL;
Daniel Abraham, Raanana, IL;
Assignee:
CephX Technologies Ltd., Herzeliya, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/60 (2017.01); G06K 9/36 (2006.01); A61B 6/14 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0044 (2013.01); A61B 6/14 (2013.01); A61B 6/5217 (2013.01); G06K 9/36 (2013.01); G06T 7/60 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30008 (2013.01); G06T 2207/30036 (2013.01);
Abstract
A system and method are described for automating the analysis of cephalometric x-rays. Included in the analysis is a method for automatic anatomical landmark localization based on convolutional neural networks. In an aspect, the system and method employ a deep database of images and/or prior image analysis results so as to improve the outcome from the present automated landmark detection scheme.
Abraham, Zeev. (2018). Automated cephalometric analysis using machine learning (U.S. Patent No. 10049457). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10049457
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile