The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Jan. 30, 2015
Applicant:

X-rite Switzerland Gmbh, Regensdorf, CH;

Inventors:

James William Vogh, Jr., Boxford, MA (US);

Olivier Calas, Lowell, MA (US);

Beat Frick, Buchs, CH;

Assignee:

X-Rite Switzerland GmbH, Regensdorf, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); H04N 1/60 (2006.01); G06K 9/52 (2006.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4661 (2013.01); G06K 9/4652 (2013.01); G06K 9/52 (2013.01); G06T 7/90 (2017.01); H04N 1/6038 (2013.01);
Abstract

The present disclosure advantageously provides apparatus, systems and methods which facilitate estimating and accounting for illumination conditions, viewing conditions and reflectance characteristics for imaged surfaces when performing color measurement, correction and/or transformation in an imaging process, such as photography. Advantageously, the disclosed apparatus, systems and methods may utilize a set of one or more illumination target elements for extrapolating illumination conditions from an imaged scene. The disclosure may be used to improve determination of color correction/transformation parameters and/or to facilitate determining a reflectance model for a target surface of interest.


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