The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Feb. 29, 2016
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi-ken, JP;

Inventors:

Eric Martinson, Mountain View, CA (US);

David Kim, Mountain View, CA (US);

Yusuke Nakano, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06N 7/00 (2006.01); G06N 99/00 (2010.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00369 (2013.01); G06F 17/30598 (2013.01); G06F 17/30864 (2013.01); G06K 9/00624 (2013.01); G06K 9/4604 (2013.01); G06K 9/6267 (2013.01); G06N 7/005 (2013.01); G06N 99/005 (2013.01); G06T 7/0081 (2013.01);
Abstract

The novel technology described in this disclosure includes an example method comprising capturing sensor data using one or more sensors describing a particular environment; processing the sensor data using one or more computing devices coupled to the one or more sensors to detect a participant within the environment; determining a location of the participant within the environment; querying a feature database populated with a multiplicity of features extracted from the environment using the location of the participant for one or more features being located proximate the location of the participant; and selecting, using the one or more computing devices, a scene type from among a plurality of predetermined scene types based on association likelihood values describing probabilities of each feature of the one or more features being located within the scene types.


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