The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Sep. 07, 2016
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Katsuyuki Hashimoto, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Provided is a laser scanning microscope including a scanning unit that scans laser light emitted from a light source two-dimensionally across a specimen, a light-detecting unit that detects light coming from the specimen, an information-acquiring unit that acquires information about an observation mode, and a control unit that controls the scanning unit based on the information acquired by the information-acquiring unit. The scanning unit includes a galvanometer scanner and a resonant scanner that are alternately operable. The control unit controls the scanning unit to deactivate the resonant scanner if the information acquired by the information-acquiring unit indicates an observation mode in which the galvanometer scanner is used alone and to maintain the resonant scanner in an active state if the information acquired by the information-acquiring unit indicates an observation mode in which the galvanometer scanner and the resonant scanner are alternately used.