The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

May. 15, 2015
Applicant:

Toppan Printing Co., Ltd., Tokyo, JP;

Inventor:

Toshiaki Yoshihara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D 3/04 (2006.01); G02B 1/11 (2015.01); G02B 1/118 (2015.01); C08F 2/48 (2006.01); G02B 1/111 (2015.01); C09D 5/00 (2006.01);
U.S. Cl.
CPC ...
G02B 1/11 (2013.01); C08F 2/48 (2013.01); C09D 5/006 (2013.01); G02B 1/111 (2013.01); G02B 1/118 (2013.01); Y10T 428/1086 (2015.01); Y10T 428/265 (2015.01);
Abstract

The present invention provides an anti-reflection film which has excellent optical properties at a low production cost. The anti-reflection film of the present invention has a low refractive index hard coat layer having low refractive index particles and a binder matrix which is formed by curing an ionizing radiation curable material on a transparent substrate. It is a feature of the anti-reflection film of the present invention that the low refractive index hard coat layer has two optically distinguishable layers from the transparent substrate side, namely, an intermediate layer and a localized layer wherein the low refractive index particles are localized, and the refractive index and optical thickness of the localized layer are in the range of 1.29-1.43 and in the range of 100-200 nm, respectively.


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