The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
May. 08, 2014
Hitachi, Ltd., Tokyo, JP;
Miyuki Takahashi, Tokyo, JP;
Hikaru Hanada, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
It is an object of the present invention to provide a technique for reducing the degradation of the image quality due to the phase difference between scanning trajectories (blades) in measurement using a non-orthogonal sampling method. Therefore, in the present invention, correction for reducing the phase difference between a plurality of scanning trajectories (blades) measured by using a non-orthogonal sampling method is performed at the time of image reconstruction. For example, the reduction of the phase difference is performed using a method of matching the phases at the intersections between blades, matching the phases of all blades at positions determined by considering the shift amount in the frequency direction, or canceling out the phase change amount of each blade obtained by calculation.