The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Nov. 22, 2012
Endress + Hauser Gmbh + Co. KG, Maulburg, DE;
Franco Ferraro, Schworstadt, DE;
Philipp Walser, Eimeldingen, DE;
ENDRESS + HAUSER GMBH + CO. KG, Maulburg, DE;
Abstract
Apparatus () for determining and/or monitoring at least one process variable, comprising: a primary side (I) and a secondary side (II), which are galvanically isolated from one another, wherein the secondary side (II) has a sensor element sensitive for the process variable () and an electronics unit () of the secondary side and provides a measurement signal representing the process variable, and wherein the primary side (I) has an electronics unit () of the primary side for evaluating the measurement signal and for producing an output signal. The apparatus () is distinguished by features including that the electronics unit () of the secondary side has a modulation unit (), which produces a modulated measurement signal by at least at times modulating at least one other piece of information onto the measurement signal representing the process variable, and that the electronics unit () of the secondary side transmits the modulated measurement signal via a galvanically isolated interface to the primary side (I).