The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Oct. 08, 2014
Applicant:

Sintokogio, Ltd., Nagoya-shi, Aichi, JP;

Inventors:

Yoshiyasu Makino, Toyokawa, JP;

Hideaki Kaga, Toyokawa, JP;

Assignee:

SINTOKOGIO, LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/90 (2006.01); B24C 1/10 (2006.01);
U.S. Cl.
CPC ...
G01N 27/9046 (2013.01); G01N 27/9033 (2013.01); B24C 1/10 (2013.01);
Abstract

The present invention provides a surface property inspection method and apparatus for inspecting the surface properties of a test object subjected to two stages of shot peening. The present invention is an apparatusincludes an AC power supply, an AC bridge circuit, and an evaluation apparatus. The AC bridge circuit is constituted by a variable resistor, a reference detector and inspection detector. The inspection detector includes a coil wound so as to oppose the surface property inspection area of the test object M; an eddy current is excited in the test object M by supplying AC power to the coil. A pass/fail judgment of the first shot peening can be made by inspecting the surface properties of a test object subjected to a second shot peening only after the second shot peening is completed.


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