The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Feb. 26, 2014
Hitachi, Ltd., Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An object of the present invention is to non-destructively obtain, in an X-ray imaging apparatus, a sectional image of a subject with spatial resolution higher than spatial resolution of an image detector. In the present invention, the image detector is two-dimensionally moved with respect to an incident X-ray for each half (180°) rotation of the subject, and a plurality of image groups (CT data sets) is obtained at different positions of the image detector. An image (sinogram) is synthesized from each image group thus obtained, which image is equal to an image obtained with a detector whose pixel size is smaller than the pixel size constituting the above described image detector. From this synthesized image, a sectional image with high spatial resolution is calculated by reconstruction calculation.