The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Jul. 27, 2012
Yutaka Tanaka, Kuwana, JP;
Katsutoshi Muramatsu, Kuwana, JP;
Hiroaki Suzuki, Kuwana, JP;
Daichi Ito, Kuwana, JP;
Masayuki Nozaki, Kuwana, JP;
Yutaka Tanaka, Kuwana, JP;
Katsutoshi Muramatsu, Kuwana, JP;
Hiroaki Suzuki, Kuwana, JP;
Daichi Ito, Kuwana, JP;
Masayuki Nozaki, Kuwana, JP;
NTN CORPORATION, Osaka, JP;
Abstract
An inspection method of a rolling element includes the steps of: projecting an X-ray from a light source to a rolling element, detecting the X-ray passing through the rolling element by a detector, calculating data of the detected X-ray to form an image, and detecting a defect in the rolling element based on the image. At the step of projecting an X-ray, the light source rotates relatively around the rolling element while the X-ray is projected to an entire region of the rolling element facing the light source. At the step of forming an image, data of the X-ray for one circuit around the rolling element is calculated to generate the image.