The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Aug. 10, 2016
Olympus Corporation, Tokyo, JP;
Akira Sato, Tokyo, JP;
Shinichi Takimoto, Tokyo, JP;
OLYPMUS CORPORATION, Tokyo, JP;
Abstract
With a spectroscopic analysis method of the present invention, by performing principal component analysis on optical spectra measured at individual positions of a specimen, principal components of a plurality of orders that constitute the individual optical spectra are calculated; for the individual orders, principal-component images in which values thereof are principal-component scores of the individual principal components corresponding to the positions are created; distribution patterns of the principal-component scores are identified in the individual principal-component images; the morphology of the specimen is identified in a morphological image in which the specimen is captured; the principal-component images that have principal-component-score distribution patterns correlated with the morphology of the specimen are identified; and the individual optical spectra are reconstructed by using the principal components of orders corresponding to the orders of the identified principal-component images.