The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Jun. 10, 2014
Applicant:

Photonicsys Ltd., Wahat Alsalam-Neveh Shalom, IL;

Inventor:

Ibrahim Abdulhalim, Wahat Alsalam-Neveh Shalom, IL;

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/552 (2014.01); G01N 29/02 (2006.01); G01N 29/24 (2006.01); B82Y 30/00 (2011.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01); G01N 21/77 (2006.01); B82Y 20/00 (2011.01);
U.S. Cl.
CPC ...
G01N 21/554 (2013.01); G01N 29/022 (2013.01); G01N 29/2418 (2013.01); B82Y 20/00 (2013.01); B82Y 30/00 (2013.01); G01N 21/648 (2013.01); G01N 21/658 (2013.01); G01N 21/7703 (2013.01); G01N 2021/7709 (2013.01); G01N 2021/7776 (2013.01); G01N 2201/068 (2013.01); G01N 2201/0612 (2013.01); G01N 2201/0633 (2013.01); G01N 2201/06113 (2013.01); Y10S 977/954 (2013.01);
Abstract

The invention is a SPR sensor that comprises a multi-layered plasmonic structure on a substrate for sensing. The SPR sensor has an enhanced figure of merit and lower limit of detection (system noise divided by the sensitivity) by at least two orders of magnitude than prior art SPR sensors. The plasmonic structure of the invention comprises a Nanostructured Porous Metal Layer (NPML) and at least one of: (a) buried dielectric layer under the nano-porous metal layer; (b) a nano-dimensional high index layer on top of the metal layer; and (c) a molecular layer for bio-functionalization adjacent to an analyte layer. The invention also encompasses many embodiments of measuring systems that comprise the SPR sensors of the invention with improved signal to noise ratio.


Find Patent Forward Citations

Loading…