The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Apr. 21, 2016
Taiwan Biophotonic Corporation, Zhubei, TW;
Yu-Tang Li, Zhubei, TW;
Chang-Sheng Chu, Zhubei, TW;
Kuan-Jui Ho, Zhubei, TW;
Pei-Cheng Ho, Zhubei, TW;
Shuang-Chao Chung, Zhubei, TW;
Chih-Hsun Fan, Zhubei, TW;
Jyh-Chern Chen, Zhubei, TW;
TAIWAN BIOPHOTONIC CORPORATION, Zhubei, TW;
Abstract
An optical measurement device includes a light source, first and second beam splitters, and first and second photodetectors. The light source that generates an emitted light beam. The first beam splitter that divides the emitted light beam into a compensation light beam and a measurement light beam. The first beam splitter directs the measurement light beam to a target. The second beam splitter that redirects the compensation light beam from the first beam splitter. A part of wavelength dependent characteristics of the first beam splitter and the second beam splitter are the same. The first photodetector that detects the compensation light beam redirected from the second beam splitter. The second photodetector that detects the measurement light beam reflected by the target and redirected by the first beam splitter. Another optical measurement device and an optical measurement method are also provided.